Raster and Electron Microscopes

ADwin systems are used in various types of scanning microscopes, e.g., laser, scanning tunneling, scanning electron, scanning force, focused ion beam (FIB), or atomic force microscopes (AFM) to control the probe and capture the surface structure.

ADwin controls an X-Y position via two analog outputs. At the same time, the reflected light is detected via analog inputs or counters and the result is stored in a scan table. This creates a 2D image point by point and line by line in a microsecond grid. For spatial representations, a third analog output is used to repeatedly move to a new focus and calculate a 3D image from up to 100 X-Y scans.